Crystallographic analysis

Previous | Next

X-Ray Diffractometer

Uva Wellassa University


Product Category/ Test Name (Matrix):

Crystallographic Analysis

Sub Category:

Crystal Structure, Material's Crystalline phases, Chemical Composition

Keywords:

Crystal Structures, Lattice Parameters, Strain, Grain size, Phase Composition, Crystal defects



Service Charge (Rs) - 5000.00









Manufacturer Rigaku Corporation Funding Source NA
Model Ultima IV Whether the equipment service can be provided to external researchers/institutions Yes
Manufactured Year 2007 Availability of Technically Competent Staff Yes
HS Code Instrument Condition Functioning well
Vendor Name Rotak Instrument(Pvt)Ltd Commencement of Operations Date 0000-00-00
Vendor Contact InstrumentPrice 31700000.00
Vendor Url https://rotak.lk/ Stage of the Record Completed
Catalog Aceess
Catalog Upload View File
Catalog Link https://www.rigaku.com/products/xrd/ultima
Institute Uva Wellassa University
Faculty Faculty of Applied Sciences
Department Department of Science and Technology
Laboratory Science and Technology
Contact Person Name Mr. RGC Jaliya
Email jaliya.chamal@gmail.com
Phone Number 0552226676
Mobile Number
Product Category Crystallographic Analysis
Sub Category Crystal Structure, Material's Crystalline phases, Chemical Composition
Testing Paremeters Crystal Structures, Lattice Parameters, Strain, Grain size, Phase Composition, Crystal defects
Description X-ray diffraction (XRD) is a powerful non-destructive technique for characterizing crystalline materials. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. This technique is commonly used in many fields, including the Pharmaceutical industry, forensic science, geological science, ceramic and glass industry, etc. For example, in the ceramic industry, XRD is used to determine elemental composition analysis, the arrangements of those elements, defects, and quantity of elements and compounds.
Relevant Instruments X-Ray Diffractometer (XRD)
Technical Specification
Number of samples per cycle 0
Number of samples per day 0
Total usage hour per day 0


Under Development Stage

Related Instruments