1. Home
  2. Instruments
  3. Scanning Electron Microscope (SEM)

About This Instrument

Observing and obtaining images with magnification over a range of about 6 orders of magnitude from 50 to 200,000 times.

Functioning well

Scanning Electron Microscope (SEM)

University of Peradeniya
  •   Faculty Faculty of Science
  •   Department Department of Geology
  •   Laboratory SEM Lab
  •   Category Imaging
  •   Sub Category Suface feature analysis
Service Charge Contact Institute
Manufacturer Carl Zeiss
Model EVO LS15
Manufactured Year 2014
HS Code —
Instrument Condition Functioning well
Instrument Price (Rs) 57.00
Funding Source University of Peradeniya
External Research Support Yes
Availability of Technical Staff Yes
Commencement of Operations 2014-05-20
Vendor Name Analytical Instruments (Pvt) Ltd
Vendor Contact 100, Elvitigala Mawatha, Colombo 08
Vendor URL —
Catalog Access —
Catalog Upload —
Catalog Link —
Stage of the Record Completed
Testing Service Imaging
Sub Category Suface feature analysis
Testing Parameters Surface features
Description Obtaining images 
Relevant Instruments Scanning Electron Microscope, Polarizing Microscopes, Epi-fluorescent Microscope
Technical Specification <p>Carl Zeiss EVO LS 15 SEM System, Oxford Inca Xact EDX system, Quorum Gold Coater, Quorum Carbon Coater</p>
Number of Samples per Cycle 9
Number of Samples per Day 9
Total Usage Hours per Day 8
0/5
Based on 0 feedbacks
5 star 0
4 star 0
3 star 0
2 star 0
1 star 0
No feedback yet for this instrument. Be the first to share your experience!