Observing and obtaining images with magnification over a range of about 6 orders of magnitude from 50 to 200,000 times.

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Scanning Electron Microscope (SEM)

University of Peradeniya


Product Category/ Test Name (Matrix):

Imaging

Sub Category:

Suface feature analysis

Keywords:





Service Charge (Rs) -









Manufacturer Carl Zeiss Funding Source University of Peradeniya
Model EVO LS15 Whether the equipment service can be provided to external researchers/institutions Yes
Manufactured Year 2014 Availability of Technically Competent Staff Yes
HS Code Instrument Condition Functioning well
Vendor Name Analytical Instruments (Pvt) Ltd Commencement of Operations Date 2014-05-20
Vendor Contact 100, Elvitigala Mawatha, Colombo 08 InstrumentPrice 57.00
Vendor Url Stage of the Record Completed
Catalog Aceess
Catalog Upload View File
Catalog Link
Institute University of Peradeniya
Faculty Faculty of Science
Department Department of Geology
Laboratory SEM Lab
Contact Person Name Mr. Danushka Gamage
Email dsashimal@pdn.ac.lk
Phone Number 0812394270
Mobile Number
Product Category Imaging
Sub Category Suface feature analysis
Testing Paremeters Surface features
Description

Obtaining images 

Relevant Instruments Scanning Electron Microscope, Polarizing Microscopes, Epi-fluorescent Microscope
Technical Specification

Carl Zeiss EVO LS 15 SEM System, Oxford Inca Xact EDX system, Quorum Gold Coater, Quorum Carbon Coater

Number of samples per cycle 9
Number of samples per day 9
Total usage hour per day 8


Under Development Stage

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