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Atomic force microscope

Atomic force microscope

Partly malfunctioning

Atomic force microscope

Sri Lanka Institute of Nanotechnology (SLINTEC)

Department Advanced Analytical Services
Laboratory Advanced Microscopy and Spectroscopy Lab
Category Microscope
Sub Category Scanning Electronic Microscope

Service Charge Contact Institute

Contact Institute

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Manufacturer	Park systems
Model	XE100
Manufactured Year	0000
HS Code	â€”
Instrument Condition	Partly malfunctioning
Instrument Price (Rs)	0.00
Funding Source	Ministry of Science
External Research Support	Yes
Availability of Technical Staff	â€”
Commencement of Operations	â€”
Vendor Name	â€”
Vendor Contact	â€”
Vendor URL	â€”
Catalog Access	â€”
Catalog Upload	â€”
Catalog Link	â€”
Stage of the Record	Completed

Testing Service	Microscope
Sub Category	Scanning Electronic Microscope
Testing Parameters	Microstructure Imaging
Description	The LEO 1420, a high-performance compact SEM, has been specifically designed for the investigation of small to medium samples The LEO 1420, a high-performance compact SEM, has been specifically designed for the investigation of small to medium samples. With a chamber designed for optimum analysis and, and the inclusion of a special cryo port, the LEO 1420 becomes first choice for biological and material applications.
Relevant Instruments	â€”

Technical Specification	â€”
Number of Samples per Cycle	0
Number of Samples per Day	0
Total Usage Hours per Day	0

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