Scanning Electron Microscope -(SEM)

Rajarata University of Sri Lanka

Faculty Technology

Department Food Technology

Laboratory Chemistry Laboratory

Category Surface Analysis

Sub Category Any solid object

Service Charge Contact Institute

Manufacturer	ZEISS
Model	EVO 18
Manufactured Year	0000
HS Code	—
Instrument Condition	Functioning well
Instrument Price (Rs)	0.00
Funding Source	ADB Grant
External Research Support	Yes
Availability of Technical Staff	—
Commencement of Operations	—
Vendor Name	Analytical Instrument (pvt)Ltd
Vendor Contact	+94112639000
Vendor URL	Https://analytical@aipl.lk
Catalog Access	Https://microscopy@zeiss.com
Catalog Upload	—
Catalog Link	Https://microscopy@zeiss.com
Stage of the Record	Completed

Testing Service	Surface Analysis
Sub Category	Any solid object
Testing Parameters	Partial Size, Elemental Composition
Description	Use for the examination and analysis of micro- and nanoparticle imaging characterization of solid objects. Typically can magnify images around 300,000 times (up to 10 nm).
Relevant Instruments	Scanning electron microscope (SEM)

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