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Scanning Electron Microscope -(SEM)

Rajarata University of Sri Lanka


Product Category/ Test Name (Matrix):

Surface Analysis

Sub Category:

Any solid object

Keywords:





Service Charge (Rs) -









Manufacturer ZEISS Funding Source ADB Grant
Model EVO 18 Whether the equipment service can be provided to external researchers/institutions Yes
Manufactured Year 0000 Availability of Technically Competent Staff
HS Code Instrument Condition Functioning well
Vendor Name Analytical Instrument (pvt)Ltd Commencement of Operations Date
Vendor Contact 0112639000 InstrumentPrice 0.00
Vendor Url Https://analytical@aipl.lk Stage of the Record Completed
Catalog Aceess Https://microscopy@zeiss.com
Catalog Upload View File
Catalog Link Https://microscopy@zeiss.com
Institute Rajarata University of Sri Lanka
Faculty Technology
Department Food Technology
Laboratory Chemistry Laboratory
Contact Person Name Dean /Faculty of Technology, Mr. Sampath Bandara
Email Dean-dean@tec.rjt.ac.lk , Scanning Electron Microscope - services@rjt.ac.lk
Phone Number 0252266380
Mobile Number 0776338496
Product Category Surface Analysis
Sub Category Any solid object
Testing Paremeters Partial Size, Elemental Composition
Description Use for the examination and analysis of micro- and nanoparticle imaging characterization of solid objects. Typically can magnify images around 300,000 times (up to 10 nm).
Relevant Instruments Scanning electron microscope (SEM)
Technical Specification
Number of samples per cycle 0
Number of samples per day 0
Total usage hour per day 0


Under Development Stage

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