| Manufacturer | Rigaku |
| Model | Ultima IV |
| Manufactured Year | 0000 |
| HS Code | — |
| Instrument Condition | Functioning well |
| Instrument Price (Rs) | 0.00 |
| Funding Source | University Capital Allocation |
| External Research Support | No |
| Availability of Technical Staff | Yes |
| Commencement of Operations | — |
| Vendor Name | — |
| Vendor Contact | — |
| Vendor URL | — |
| Catalog Access | — |
| Catalog Upload | — |
| Catalog Link | — |
| Stage of the Record | Completed |
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| Testing Service | X ray Diffractometer |
| Sub Category | Crystal Structure, Crystalline phases, Chemical Composition information |
| Testing Parameters | Crystal Structures, Lattice Parameters, Atomic arrangement, Crystallite size |
| Description | X Ray Diffraction Analysis is important to investigate crystalline material structure as well as atomic arrangement, crystallite size and imperfections. |
| Relevant Instruments | Rigaku Ultima IV XRD |
| Technical Specification | — |
| Number of Samples per Cycle | 1 |
| Number of Samples per Day | 10 |
| Total Usage Hours per Day | 8 |
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