X-Ray Diffractometer

Manufacturer	Bruker
Model	Bruker Axs D8 Focus
Manufactured Year	0000
HS Code	—
Instrument Condition	Not Functioning
Instrument Price (Rs)	0.00
Funding Source	Ministry of Science
External Research Support	Yes
Availability of Technical Staff	—
Commencement of Operations	—
Vendor Name	—
Vendor Contact	—
Vendor URL	—
Catalog Access	—
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Stage of the Record	Completed

Testing Service	Crystallographic Analysis
Sub Category	Crystal Structure, Material's Crystalline phases, Chemical Composition
Testing Parameters	Crystal Structures, Lattice Parameters, Strain, Grain size, Phase Composition, Crystal defects
Description	X-ray diffraction (XRD) is a powerful non-destructive technique for characterizing crystalline materials. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. This technique is commonly used in many fields, including the Pharmaceutical industry, forensic science, geological science, ceramic and glass industry, etc. For example, in the ceramic industry, XRD is used to determine elemental composition analysis, the arrangements of those elements, defects, and quantity of elements and compounds.
Relevant Instruments	X-Ray Diffractometer (XRD)