| Manufacturer | Funding Source | NRC | |
| Model | Whether the equipment service can be provided to external researchers/institutions | No | |
| Manufactured Year | 0000 | Availability of Technically Competent Staff | |
| HS Code | Instrument Condition | Functioning well | |
| Vendor Name | Commencement of Operations Date | 0000-00-00 | |
| Vendor Contact | InstrumentPrice | 0.00 | |
| Vendor Url | Stage of the Record | Incomplete | |
| Catalog Aceess | |||
| Catalog Upload | View File | ||
| Catalog Link |
| Institute | National Institute of Fundamental Studies |
| Faculty | |
| Department | |
| Laboratory | NIFS |
| Contact Person Name | |
| Phone Number | |
| Mobile Number |
| Product Category | Surface charge measurements |
| Sub Category | |
| Testing Paremeters | |
| Description | Can obtain surface charge measurements in solids, membranes , nanotubes and thin films |
| Relevant Instruments |
| Technical Specification | |
| Number of samples per cycle | 0 |
| Number of samples per day | 0 |
| Total usage hour per day | 0 |
